MelssWizard is an enhanced
next generation Tester for MIXED TECHNOLOGY BOARDS. This
all new ATE helps the customers to test their complex
Printed Circuit Boards (PCB's) which can have simple devices
from the TTL, CMOS family to latest generation VLSI Components
and ASIC's.
The Tester can now be directly interfaced to the PC using
the parallel port, hence freedom from obsolescence of PC
interfaces and hardware.
MW48160 can directly support testing of the Device Packages
from old generation DIP packages to the new generation
SOIC, PLCC, GFP Packages, having high pin counts upto 160
Pins.
MW48160 uses the powerful and field proven VI Test Methods
like MVI, SVI, WVI and GVI to learn the signatures from
a known good board and compare the same with the faulty
board. This method of testing assists the user to test
their boards without the need to rig up an expensive board
specific test jig or without writing tedious test programs.
MW48160 OFFERS THE FOLLOWING TEST METHODS
POWER-ON TEST
IN-CIRCUIT FUNCTIONAL TEST (ICFT)
In-Circuit, Functional Test, facility helps the user to
do Power-on functional testing of Digital Devices. A
comprehensive library of devices covering TTL, CMOS,
ECL, LV, CMOS HV Logic families, Memories, PAL's, Micro
processors, Micro Controllers and their peripherals,
etc. has been provided.
IN-CIRCUIT ANALOG TEST FACILITY
This facility allows the user to test the Analog Devices
like Op-Amp's, Regulators, Comparators, Opto-Couplers
and Mixed Signal Devices like ADC's and DAC's functionally.
The in-built Intelligent Algorithm tests the Op-Amps
for
its various configurations like Voltage Follower, Inverting
and Non-Inverting Amplifier modes. The standard suite
for Cluster Testing facility for all types of Analog
Devices
as well as Mixed Signal Devices is also provided.
ADVANCED VECTORLESS TESTING TOOL SUITE for MIXED TECHNOLGY
BOARDS
VOLTAGE-CURRENT [VI] SIGNATURE ANALYSIS
This test checks the dynamic impedance [Voltage versus
Current] of nodes of a Device or PCB under Power-off
conditions. The results, which are very unique for each
node, can be graphically displayed or compared automatically
against stored traces learnt from a known good board
or device as a reference. Normally the traces are taken
with respect to Ground.
MOVING REFERENCE VI [MVI]
MVI is the test methodology where the VI characteristics
are taken with the reference being shifted from one pin
after another automatically. This assists in the diagnosis
of pin-to-pin faults of Devices, Input and Output impedance
faults of Analog Devices etc.
GUARDED VI [GVI]
This facility allows the user to view and analyse the characteristic
of an individual component connected to a node. GVI allows
to user to guard a particular node and hence the effect
of the other components on the circuit junction under test
is drastically reduced. The GVI is a much more faithful
representation of the characteristics of the individual
Component Under Test.
SUB-THRESHOLD VI [SVI]
SVI Test allows the user to apply a very low stimulus [below
diode turn-on voltage] combined with impedance matching
capabilities. This helps in taking VI characteristic of
sensitive components / nodes without turning on the diode
junctions of the connected circuitry.
WIZARD VI [WVI]
A proprietary Algorithm for testing High Pin Count SMT
Devices quickly. This gives tremendous advantages to the
user in terms of TIME to REPAIR.
CIRCUIT TRACER [Power-On & Power Off)
This learns the interlinks of the IC Pins and the links
between different ICs and other components from a good
working board using clips and grabbers; the links data
is stored for future comparison.
The reverse engineering process using the optional CAD
package can be used for regenerating the schematic of the
PCB.
PROGRAMMABLE FEED RESISTANCE
MW48160 offers the choice of a wide range of Feed Resistances:
14.3 Ohms to 470 K Ohms. You can match the impedance
of the Device under test by selecting the right Feed
Resistance
to the DUT. This means that measured VI or Analog response
would be true and meaningful. Hence this results in improved
fault coverage.
MW48160 can directly support testing of Device Packages
from through hole technology DIP packages to the new generation
SOIC, SOL, PLCC, TSOP, VSOP, SSOP, QFP, PQFP, TQFP, BQFP,
SOT packages, having Pin counts upto 160 Pins.
Factory upgrade is possible upto 400 Vectorless Channels
for Specific applications.
ENHANCED SPECIFICATIONS OF MW48160
MW48160
Vectorless Test Tool Suite
Power Off Vectorless Test Methods : VI,
MVI, SVI, GVI, Dual VI & WVI
Base No. of Channels : 80 Channels
Expandable to 160
